Not a U.S. government website. NDD is an independent vulnerability database by Volerion and is not affiliated with or endorsed by NIST or NVD.

CVE-2026-68991 Details

ANALYZED

This CVE record has been analyzed and enriched by NVDAPI.com as an independent party.

Description

In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.

Metrics

CVSS 3.x Severity and Vector Strings:

VolerionCVSS-B:6.1 MEDIUMVector:CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:L/A:H

References to Advisories, Solutions, and Tools

By selecting these links, you will be leaving this site. These are references gathered from the official CVE record and are not endorsed by Volerion.

URL	Source(s)	Tag(s)
https://semiconductor.samsung.com/support/quality-support/product-security-updates/	a8bfbd5c-5645-475e-a8f4-6c140c17bd29	AdvisoryBundleVendor

Weakness Enumeration

CWE-ID	CWE Name	Source
CWE-787	Out-of-bounds Write	a8bfbd5c-5645-475e-a8f4-6c140c17bd29

Affected Products

Product	Versions
Samsung Exynos ENN NeuralNetworks HAL	All versions
CPE No CPEs found in CPE dictionary for this product. Remediation No remediation found in references.

Change History

1 change record found show changes